DOI resolved by resea

CTFFIND4: Fast and accurate defocus estimation from electron micrographs

CTFFIND4: Fast and accurate defocus estimation from electron micrographs on resea.org. DOI 10.1016/j.jsb.2015.08.008. Alexis Rohou, Nikolaus Grigorieff.

Alexis Rohou, Nikolaus Grigorieff

https://resea.org/10.1016/j.jsb.2015.08.008

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Abstract

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